Determination of the lattice constants of epitaxial layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference27 articles.
1. X-ray diffraction studies of thin films and multilayer structures
2. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
3. X-ray study of AlxGa1−xAs epitaxial layers
4. Determination of the lattice constant of epitaxial layers of III-V compounds
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