Characterization of misfit dislocations in epitaxial (001)-oriented TiN, NbN, VN, and (Ti,Nb) N film heterostructures by transmission electron microscopy-Reference-Cited by-同舟云学术

Characterization of misfit dislocations in epitaxial (001)-oriented TiN, NbN, VN, and (Ti,Nb) N film heterostructures by transmission electron microscopy

Published:1994-01 Issue:1-2 Volume:135 Page:309-317
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Hultman L.,Shinn M.,Mirkarimi P.B.,Barnett S.A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference17 articles.

1. Growth of single‐crystal TiN/VN strained‐layer superlattices with extremely high mechanical hardness

2. Growth, structure, and microhardness of epitaxial TiN/NbN superlattices

3. Enhanced hardness in lattice‐matched single‐crystal TiN/V0.6Nb0.4N superlattices

4. P.B. Mirkarimi, S.A. Barnett, K.M. Hubbard, T.R. Jervis and L. Hultman, J. Mater. Res., submitted.

5. Divergent pearlite in a manganese eutectoid steel

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