A study of metalorganic molecular beam epitaxy growth of InAs by mass spectrometry and reflection high-energy electron diffraction

Author:

Liang B.W.,Chin T.P.,Wang L.Y.,Tu C.W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference9 articles.

1. Metalorganic CVD of GaAs in a molecular beam system

2. Chemical beam epitaxy of InP and GaAs

3. Molecular Beam Epitaxial Growth of GaAs Using Triethylgallium and Arsine

4. III–V Heterostructures for Electronic/Photonic Devices;Fraas,1989

5. III–V Heterostructures for Electronic/Photonic Devices;Houng,1989

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Identification of volatile products in low pressure hydrocarbon electron cyclotron resonance reactive ion etching of InP and GaAs;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1993-11

2. The effects of arsenic overpressure in metalorganic molecular beam epitaxy of GaAs and InAs;Journal of Crystal Growth;1990-10

3. Progress in chemical beam epitaxy;Journal of Crystal Growth;1990-10

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