Computation of striated impurity distributions in melt-grown crystals, taking account of periodic remelt-Reference-Cited by-同舟云学术

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Computation of striated impurity distributions in melt-grown crystals, taking account of periodic remelt

Published:1979-11 Issue:5-6 Volume:47 Page:680-692
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Van Run A.M.J.G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference24 articles.

1. Crystal Growth and Characterization;Carruthers,1975

2. Quantitative Analysis of Microsegregation in Silicon Grown by the Czochralski Method

3. Semiconductor Silicon;Murgai,1977

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