Formation of high mobility two-dimensional electron gas at etch-regrown AlGaAs/GaAs interface prepared by chlorine gas etching and MBE in an UHV multichamber system
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference6 articles.
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1. Electronic properties of etched–regrown heterostructure interfaces;Journal of Crystal Growth;2003-04
2. Etching temperature dependent mobilities up to at chlorine etched and regrown interfaces;Physica E: Low-dimensional Systems and Nanostructures;2002-03
3. Characterization of in situ etched and molecular beam epitaxy regrown GaAs interfaces using capacitance–voltage measurements, far infrared spectroscopy, and magnetotransport measurements;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2000
4. Ultraclean etching of GaAs by HCl gas and in situ overgrowth of (Al)GaAs by molecular beam epitaxy;Journal of Applied Physics;1998-01
5. Temperature dependence of GaAs chemical etching using AsCl3;Journal of Crystal Growth;1996-07
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