Study on structural properties of epitaxial silicon films on annealed double layer porous silicon-Reference-Cited by-同舟云学术

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Study on structural properties of epitaxial silicon films on annealed double layer porous silicon

Published:2012-06 Issue:12 Volume:407 Page:2278-2281
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Yue Zhihao,Shen Honglie,Cai Hong,Lv Hongjie,Liu Bin

Funder

National Nature Science Foundation of China

Jiangsu Innovation Program for Graduate Education

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Fixed abrasive diamond wire machining—part I: process monitoring and wire tension force

2. Recovery of silicon from kerf loss slurry waste for photovoltaic applications

3. Review of Layer Transfer Processes for Crystalline Thin-Film Silicon Solar Cells

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