Electrical conduction mechanism and dielectric characterization of MnTPPCl thin films-Reference-Cited by-同舟云学术

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Electrical conduction mechanism and dielectric characterization of MnTPPCl thin films

Published:2018-06 Issue: Volume:539 Page:1-7
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Meikhail M.S.,Oraby A.H.,El-Nahass M.M.,Zeyada H.M.,Al-Muntaser A.A.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Temperature dependence of dielectric losses in chalcogenide glasses;Giuntini;J. Non-Cryst. Solids,1981

2. Porphyrins in analytical chemistry. A review;Biesaga;Talanta,2000

3. Thin Film Phenomena;Chopra,1969

4. Ultrathin organic films grown by organic molecular beam deposition and related techniques;Forrest;Chem. Rev.,1997

5. Phosphorescent porphyrin probes in biosensors and sensitive bioassays;Papkovsky;Biochem. Soc. Trans.,2000

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