Optical and physical properties of different composition of InxSe1−x thin films
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
2. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
3. Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra
4. Optical properties of thermally evaporated amorphous As40S60−xSex films
5. Determination of the optical constants of thermally evaporated amorphous As40S60, As35S65 and As30S70 using transmission measurements
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