Generative inspection process and probe path planning for coordinate measuring machines-Reference-Cited by-同舟云学术

Generative inspection process and probe path planning for coordinate measuring machines

Published:1996-01 Issue:4 Volume:15 Page:240-255
ISSN:0278-6125
Container-title:Journal of Manufacturing Systems
language:en
Short-container-title:Journal of Manufacturing Systems

Author:

Gu P.,Chan K.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Hardware and Architecture,Software,Control and Systems Engineering

Reference16 articles.

1. Taking the Measure of CMMs;Shaffer;American Machinist,1982

2. A Review of AI Planning Techniques;Tate,1987

3. Planning as Search: A Quantitative Approach;Korf;Artificial Intelligence,1987

4. Expert System for Inspection Planning;ElMaraghy;Annals of CIRP,1987

5. C.W. Brown and D.A. Gyorog, “Generative Inspection Process Planner for Integrated Production,” Symposium on Advances in Integrated Product Design and Manufacturing, ASME 1990 Winter Annual Meeting.

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