Development of the Scanning Atom Probe and Atomic Level Analysis

Author:

Nishikawa Osamu,Ohtani Yoshikatsu,Maeda Kiyoshi,Watanabe Masafumi,Tanaka Keiji

Funder

Kementerian Pendidikan Malaysia

New Energy and Industrial Technology Development Organization

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference25 articles.

1. The atom-probe field ion microscope;Müller;Rev. Sci. Instrum.,1968

2. Performance of the new high mass resolution time of flight atom probe;Nishikawa;Rev. Sci. Instrum.,1981

3. Field Ion Microscopy, Principles and Applications;Müller,1969

4. Field ion microscopy of multilayer film devices;Larson;Microsc. Microanl.,1998

5. Atom probe field ion microscopy, Monographs on Phys. Chem. of Materials 52;Miller,1996

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