Performance of the new high mass resolution time of flight atom probe
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1136701
Reference9 articles.
1. The Atom‐Probe Field Ion Microscope
2. Energy deficits in pulsed field evaporation and deficit compensated atom‐probe designs
3. Premature field evaporation in the atom probe
4. New Directional and Energy Focusing Time of Flight Mass Spectrometers for Special Tasks in Vacuum and Surface Physics
5. Surface analysis and grain-boundary segregation measurements using atom-probe techniques
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