Kelvin probe microscopy measurements of surface potential change under wear at low loads
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics
Reference27 articles.
1. A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALS
2. Micro Kelvin probe for local work-function measurements;Baumgärtner;Rev. Sci. Instrum.,1988
3. Scanning tunneling microscopy;Binnig;Helv. Phys. Acta,1982
4. High-resolution capacitance measurement and potentiometry by force microscopy;Martin;Appl. Phys. Lett.,1988
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