Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization
Author:
Affiliation:
1. The Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
2. Materials and Manufacturing Directorate Air Force Research Laboratory Wright‐Patterson Air Force Base Dayton OH 45433 USA
Funder
U.S. Department of Energy
Office of Science
Publisher
Wiley
Subject
Biomaterials,Biotechnology,General Materials Science,General Chemistry
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/smll.202002878
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