Generation lifetime monitoring on high resistivity silicon using gated diodes-Reference-Cited by-同舟云学术

Generation lifetime monitoring on high resistivity silicon using gated diodes

Published:1990-03 Issue:1 Volume:288 Page:48-53
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Vanstraelen G.,De Backker K.,Debusschere I.,Claeys C.,Declerck G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. W. Shockley and W.T. Read, Phys. Rev. 87(5) 835.

2. The gate-controlled diode s0 measurement and steady-state lateral current flow in deeply depleted MOS structures

3. Interpretation of surface and bulk effects using the pulsed MIS capacitor

4. Effects of surface states on relaxation phenomena in MOS capacitors

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Extraction of bulk generation lifetime and surface generation velocity in high-resistivity silicon by means of gated diodes;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-01

2. Extended wavelength InGaAs infrared (1.0–2.4 μm) detector arrays on SCIAMACHY for space-based spectrometry of the Earth atmosphere;Infrared Physics & Technology;2001-02

3. The ZEUS microvertex detector;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-06

4. On the accuracy of generation lifetime measurement in high-resistivity silicon using PN gated diodes;IEEE Transactions on Electron Devices;1999-04

5. Development of a detector-compatible JFET technology on high-resistivity silicon;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1998-05