Metrology of reflection optics for synchrotron radiation

Author:

Takacs Peter Z.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Focal shift induced by source displacements and optical figure errors;Journal of Synchrotron Radiation;2019-08-20

2. Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler;Advances in Metrology for X-Ray and EUV Optics VII;2017-09-07

3. Deterministic retrieval of surface waviness by means of topography with coherent X-rays;Journal of Synchrotron Radiation;2002-06-30

4. A profilometer for synchrotron radiation mirrors;Journal of Electron Spectroscopy and Related Phenomena;1996-05

5. Design parameters for hard x-ray mirrors: the European Synchroton Radiation Facility case;Optical Engineering;1995-02-01

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