Deterministic retrieval of surface waviness by means of topography with coherent X-rays-Reference-Cited by-同舟云学术

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Deterministic retrieval of surface waviness by means of topography with coherent X-rays

Published:2002-06-30 Issue:4 Volume:9 Page:223-228
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Souvorov A.,Yabashi M.,Tamasaku K.,Ishikawa T.,Mori Y.,Yamauchi K.,Yamamura K.,Saito A.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2002/04/00/ma2006/ma2006.pdf

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Focusing Mirror for Coherent Hard X-Rays;Synchrotron Light Sources and Free-Electron Lasers;2020

4. X-ray multilayer mid-frequency characterizations using speckle scanning techniques;Advances in Metrology for X-Ray and EUV Optics VII;2017-09-07

5. An equivalent source to describe realistic synchrotron hard X-rays;Applied Physics B;2016-10-15

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