Characterization of thin films for biomaterial applications using PIXE and RBS-Reference-Cited by-同舟云学术

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Characterization of thin films for biomaterial applications using PIXE and RBS

Published:1994-12 Issue:1-3 Volume:353 Page:597-600
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Tsuboi Y.,Albrektsson T.,Sennerby L.,Johansson C.,Ektessabi A.M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Fundamentals of Surface and Thin film Analysis;Feldman,1986

2. Surface Modification and Alloys;Mayer,1983

3. Mechanisms of adhesion enhancement using reactive ion mixing

4. Simulation of ion beam assisted deposition—a comparison with experimental results

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. NIXE: Neutron Depth Profiling coupled with Particle Induced X-ray Emission;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-02

2. X-ray Spectrometry;Analytical Chemistry;1996-01-01

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