Tracing and elimination of process-induced contaminations in sputter-deposited targets by elastic recoil detection analysis-Reference-Cited by-同舟云学术

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Tracing and elimination of process-induced contaminations in sputter-deposited targets by elastic recoil detection analysis

Published:1995-08 Issue:1 Volume:362 Page:143-150
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Assmann W,Maier H.J

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. High vacuum sputter deposition of nuclear accelerator targets

2. State of the art of high vacuum sputter deposition of nuclear accelerator targets

3. Characterization of targets

4. The light element impurity content of self-supporting carbon foils

5. Elastic recoil detection analysis with heavy ions

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Targets For Particle Accelerators;digital Encyclopedia of Applied Physics;2003-04-15

2. High energy heavy ions in materials characterization at NSC Pelletron;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

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