Author:
Assmann W.,Huber H.,Steinhausen Ch.,Dobler M.,Glückler H.,Weidinger A.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference42 articles.
1. Backscattering Spectrometry;Chu,1978
2. Materials Analysis by Ion Channeling;Feldman,1982
3. Fundamentals of Surface and Thin Film Analysis;Feldman,1986
4. Technique for profiling1H with 2.5‐MeV Van de Graaff accelerators
5. The use of 6Li and 35Cl ion beams in surface analysis
Cited by
112 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献