Limitations of Near Edge X-ray Absorption Fine Structure as a tool for observing conduction bands in chalcopyrite solar cell heterojunctions-Reference-Cited by-同舟云学术

Limitations of Near Edge X-ray Absorption Fine Structure as a tool for observing conduction bands in chalcopyrite solar cell heterojunctions

Published:2013-10 Issue: Volume:190 Page:42-46
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Johnson Benjamin,Klaer Jo,Merdes Saoussen,Gorgoi Mihaela,Höpfner Britta,Vollmer Antje,Lauermann Iver

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Characterisation and modelling of chalcopyrite solar cells

2. Electronic states in a-Si:H/c-Si heterostructures

3. Interface Engineering of Inorganic Thin-Film Solar Cells - Materials-Science Challenges for Advanced Physical Concepts

4. Thin-Film Compound Semiconductor Voltaics-2009;Merdes,2010

5. Band alignment at CdS/CuInS2 heterojunction

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