Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope-Reference-Cited by-同舟云学术

Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope

Published:2010-05 Issue: Volume:178-179 Page:303-316
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Escher M.,Winkler K.,Renault O.,Barrett N.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg. K. Hamrin, J. Hedman, G. Johansson,T. Bergmark, S.-E. Karlsson, I. Lindgren, B. Lindberg, ESCA, Atomic, Molecularand Solid State Structure Studied by Means of Electron Spectroscopy, Uppsala, 1967.

2. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Briggs,2003

3. Photoelectron spectroscopy—An overview

4. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Artyushkova,2003

5. Photoelectron microscopy and applications in surface and materials science

Cited by 64 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Operando investigation of nanocrystal-based device energy landscape: Seeing the current pathway;Nano Research;2024-05-18

2. Ferroelastic Twin Angles at the Surface of CaTiO3 Quantified by Photoemission Electron Microscopy;Physical Review Letters;2024-01-29

3. Development of a Photoemission Microscopy Apparatus Using a Vacuum Ultraviolet Laser;e-Journal of Surface Science and Nanotechnology;2023-10-12

4. Mapping the Energy Landscape from a Nanocrystal-Based Field Effect Transistor under Operation Using Nanobeam Photoemission Spectroscopy;Nano Letters;2023-01-24

5. Imaging and measuring the electronic properties of epitaxial graphene with a photoemission electron microscope;Journal of Applied Physics;2022-01-07