Comparison of L-curve and LOOCV depth profiles from TAARXPS data-Reference-Cited by-同舟云学术

Comparison of L-curve and LOOCV depth profiles from TAARXPS data

Published:2017-01 Issue: Volume:214 Page:1-7
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Paynter R.W.

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. An ARXPS primer

2. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

3. Regularization: A stable and accurate method for generating depth profiles from angle-dependent XPS data

4. Numerical Methods for The Solution of Ill-Posed Problems;Tikhonov,1995

5. Rank-Deficient and Discrete Ill-Posed Problems;Hansen,1998

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