Nano-scale properties of defects in compound semiconductor surfaces-Reference-Cited by-同舟云学术

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Nano-scale properties of defects in compound semiconductor surfaces

Published:1999-01 Issue:4-8 Volume:33 Page:121-303
ISSN:0167-5729
Container-title:Surface Science Reports
language:en
Short-container-title:Surface Science Reports

Author:

Ebert Ph.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Chemistry

Reference362 articles.

1. Defect and impurity engineered semiconductors and devices,1995

2. Defects in electronic materials II,1997

3. Doping in III–V Semiconductors;Schubert,1993

4. Point Defects in Solids: Semiconductors and Molecular Crystals,1975

5. Defects and Their Structure in Nonmetallic Solids,1975

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