Hybrid simulation method of quantum characteristics for advanced Si MOSFETs under extreme conditions by incorporating simplified master equation with TCAD
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Published:2024-08
Issue:
Volume:63
Page:107856
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ISSN:2211-3797
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Container-title:Results in Physics
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language:en
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Short-container-title:Results in Physics
Author:
Zhu XiaohuiORCID,
Yin Huaxiang