Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. E. H. Nicollian and J. R. Brews, MOS Physics and Technology, John Wiley, New York (1982)
2. D. K. Schroder, Semiconductor Material and Device Characterization, John Wiley, New York (1990)
3. A linear-sweep MOS-C technique for determining minority carrier lifetimes
4. A modified linear sweep technique for MOS-C generation rate measurements
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献