Temperature effects of low noise InGaP/InGaAs/GaAs PHEMTs

Author:

Huang H.K.,Wang C.S.,Wang Y.H.,Wu C.L.,Chang C.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. W-band low-noise InAlAs/InGaAs lattice-matched HEMT’s;Chao;IEEE Electron. Dev. Lett.,1990

2. Ultralow-noise W-band pseudomorphic InGaAs HEMT’s;Tan;IEEE Electron. Dev. Lett.,1990

3. Determination of valence and conduction-band discontinuities at the (Ga,In)P/GaAs heterojunction by C–V profiling;Rao;J. Appl. Phys.,1986

4. Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT’s by means of low-frequency noise and transconductance dispersion characterizations;Chan;IEEE Trans. Electron. Dev.,1994

5. Novel InGaP/AlGaAs/InGaAs heterojunction FET for X-Ku band power applications;Okamoto;IEEE MTT-S Dig.,1997

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