Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals-Reference-Cited by-同舟云学术

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Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals

Published:2001-07 Issue: Volume:467-468 Page:1001-1004
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Takahashi Yumiko,Iida Atuso,Takanishi Yoichi,Ogasawara Toyokazu,Takezoe Hideo

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Ferroelectric and Antiferroelectric Liquid Crystals;Lagerwall,1999

2. Correspondence between Smectic Layer Switching and DC Hysteresis of Apparent Tilt Angle in an Antiferroelectric Liquid Crystal Mixture

3. Time-Resolved X-Ray Studies of Layer Behaviour During Operation of a Ferroelectric Device

4. Characterization of the Local Layer Structure of a Broad Wall in a Surface Stabilized Ferroelectric Liquid Crystal Using Synchrotron X-Ray Micro-Diffraction

5. Structure of Needlelike Defect in Homogeneously Aligned Cells of a Ferroelectric Liquid Crystal Mixture Studied Using X-Ray Microbeam

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mechanisms of switching in an antiferroelectric liquid crystal device revealed by time‐resolved X‐ray scattering;Liquid Crystals;2006-04-01

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