Time-Resolved X-Ray Studies of Layer Behaviour During Operation of a Ferroelectric Device
Author:
Affiliation:
1. a Schuster Laboratory, Manchester University , Manchester , M13 9PL , U.K.
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
https://www.tandfonline.com/doi/pdf/10.1080/10587259708041817
Reference14 articles.
1. Submicrosecond bistable electro‐optic switching in liquid crystals
2. Electrooptical Switching of Ferroelectric Liquid Crystals in Electrically Distorted Chevron Structure
3. X-ray studies on layer structure and bistability in ferroelectric liquid crystals
4. Time‐resolved x‐ray diffraction station: X‐ray optics, detectors, and data acquisition
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1. Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-07
2. Time-resolved X-Ray Scattering Studies of Reversible Layer Flexing in a Surface Stabilised Ferroelectric Liquid Crystal Device;Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals;2001-06-01
3. Dynamic Behaviour of the Local Layer Structure of Antiferroelectric Liquid Crystals under a High Electric Field Measured by Time-resolved Synchrotron X-Ray Microbeam Diffraction;Japanese Journal of Applied Physics;2001-05-15
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