A simulation of a CdTe gamma ray detector based on collection efficiency profiles as determined by lateral IBIC

Author:

Vittone E.,Fizzotti F.,Lo Giudice A.,Polesello P.,Manfredotti C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. The establishment and performance of IBIC microscopy at Fudan University;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07

2. The study of response of wide band gap semiconductor detectors using the Geant4;Nuclear Technology and Radiation Protection;2014

3. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17

4. Frontal IBICC study of the induced proton radiation damage in CdTe detectors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07

5. Cadmium zinc telluride and its use as a nuclear radiation detector material;Materials Science and Engineering: R: Reports;2001-04

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