Frontal IBICC study of the induced proton radiation damage in CdTe detectors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference7 articles.
1. Radiation damage measurements in room-temperature semiconductor radiation detectors
2. Ion microbeam studies of cadmium zinc telluride radiation detectors by IBICC
3. Imaging of radiation detectors properties by IBIC
4. Investigation on the electric field profile in CdTe by ion beam induced current
5. A simulation of a CdTe gamma ray detector based on collection efficiency profiles as determined by lateral IBIC
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1. Effect of Electron Irradiation on Spectroscopic Properties of Schottky Barrier CdTe Semiconductor Detectors;High-Z Materials for X-ray Detection;2023
2. Effects of electron irradiation on spectrometric properties of Schottky barrier CdTe radiation detectors;International Journal of Modern Physics: Conference Series;2020-01
3. Correlated analysis of 2 MeV proton-induced radiation damage in CdZnTe crystals using photoluminescence and thermally stimulated current techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-11
4. Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy;Micron;2016-09
5. Time and thermal recovery of irradiated CdZnTe detectors;Semiconductor Science and Technology;2006-06-26
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