A general framework for numerical calculation of properties of charged-particle optical systems

Author:

van der Stam M.A.J.,Kruit P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference19 articles.

1. Field evaluation from potentials calculated by the finite element method for ray tracing: the slice method

2. M.A.J. van der Stam, Dissertation Delft University of Technology, 1996.

3. J. Chmelı́k, J.E. Barth in: W.B. Thompson, M. Sato, A.V. Crewe (Eds.), Charged Particle Optics, Proceedings of the SPIE 2014, 1993, p. 133.

4. Magnetic Electron Lenses;Hawkes,1982

5. Computer assistance for the pre-design of optical instruments

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1. Notes and References;Principles of Electron Optics;2018

2. A new monochromator with multiple offset cylindrical lenses 2: Aberration analysis and its applications;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2015-11

3. Charged Particle Optics;Lithography;2013-03-07

4. Calculation of aberration coefficients by ray tracing;Ultramicroscopy;2009-10

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