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Calculation of aberration coefficients by ray tracing

  • Published:2009-10 Issue:11 Volume:109 Page:1365-1373
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Oral M.,Lencová B.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Differential algebraic method for aberration analysis of typical electrostatic lenses

2. B. Lencová, Program ELD for electrostatic lens computation, Version 3.70 user manual, SPOC Brno, 2002.

3. A new program for the design of electron microscopes

4. E. Munro, et al., MEBS (Munro's Electron Beam Software) 〈http://www.mebs.co.uk〉.

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