Author:
El-Kholi A,Mohr J,Nazmov V
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
14 articles.
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1. The SKIF X–Techno Beamline Project;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-12
2. The SKIF X-Techno Beamline Project;Поверхность. Рентгеновские, синхротронные и нейтронные исследования;2023-11-01
3. Polymethyl Metacrylate with a Molecular Weight of 107 g/mol for X-ray Lithography;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-06
4. Polymethyl Methacrylate with a Molecular Weight of 10<sup>7</sup> g/mol for X-Ray Lithography;Поверхность. Рентгеновские, синхротронные и нейтронные исследования;2023-06-01
5. Investigation of chemical changes in PMMA induced by 1.6 MeV He+ irradiation by ion beam analytical methods (RBS-ERDA) and infrared spectroscopy (ATR-FTIR);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07