Modelling and simulations for 40nm lines/spaces in 1μm Shipley SPR510A resist using PRIME process

Author:

Arshak K,Arshak A,Mihov M,McDonagh D

Publisher

Elsevier BV

Subject

General Engineering

Reference16 articles.

1. Sub 35nm metal gratings fabricated using PMMA with high contrast developers;Thoms;Microelecron. Engng,1998

2. Positive resist image by dry etching: new dry developed positive working system for electron beam and deep ultraviolet lithography;Pierrat;J. Vac. Sci. Techol.,1989

3. SAMPLE 1.7a, University of California, Berkeley, 1 March 1989.

4. I. Adesida, Electron energy dissipation in layered media, PhD Thesis, Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, 1979.

5. SLITS simulator: modelling and simulation of ebeam/deep-ultraviolet exposure and silylation;McDonagh;Opt. Engng,1996

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