Zinc diffusion process investigation of InP-based test structures for high-speed avalanche photodiode fabrication
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Published:2000-08
Issue:8
Volume:31
Page:635-639
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ISSN:0026-2692
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Container-title:Microelectronics Journal
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language:en
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Short-container-title:Microelectronics Journal
Author:
Yun Ilgu,Hyun Kyung-Sook
Subject
General Engineering
Cited by
20 articles.
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