Effect of ionizing radiation on MOS capacitors

Author:

Chauhan R.K.,Chakrabarti P.

Publisher

Elsevier BV

Subject

General Engineering

Reference20 articles.

1. Variable capacitance with large capacity charge;Moll;Wescon Conv. Rec.,1959

2. Miniature radiation dosimeter for in-vivo radiation measurement;Hughes;Int. J. Radiat. Oncal., Biol., Phys.,1988

3. Radiation induced interface states of polysilicon gate MOS capacitors using low temperature gate oxidation;Naruka;IEEE Trans. Nucl. Sci.,1983

4. Recovery of damage in rad-hard MOS Devices during and after irradiation by electrons, protons, alphas, and gamma rays;Brucker;IEEE Trans. Nucl. Sci.,1983

5. Correlating the radiation response of MOS capacitors and transistors;Winokur;IEEE Trans. Nucl. Sci.,1984

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