Thermal characterization of microsystems by means of high-resolution thermography-Reference-Cited by-同舟云学术

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Thermal characterization of microsystems by means of high-resolution thermography

Published:1997-03 Issue:3 Volume:28 Page:327-335
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Ashauer M.,Ende J.,Glosch H.,Haffner H.,Hiltmann K.

Publisher

Elsevier BV

Subject

General Engineering

Reference6 articles.

1. Thermal characterization of power transistors;Oettinger;IEEE Trans. Electron Devices,1976

2. Infrared Detectors;Hamamatsu Photonics,1993

3. Thermische Charakterisierung von Bauteilen und Materialien der Mikromechanik;Ende,1994

4. Properties of Silicon;INSPEC,1988

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Kinetics determination of fast exothermic reactions with infrared thermography in a microreactor;Journal of Flow Chemistry;2020-02-13

2. In situ high-resolution thermal microscopy on integrated circuits;Optics Express;2017-08-28

3. Measuring enthalpy of fast exothermal reaction with infrared thermography in a microreactor;Chemical Engineering Journal;2016-07

4. Thermal microscopy of electronic materials;Materials Science in Semiconductor Processing;2016-03

5. Microscale thermometry: A review;Microelectronic Engineering;2015-12

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