Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method-Reference-Cited by-同舟云学术

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Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method

Published:1997-03 Issue:3 Volume:28 Page:293-300
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Oliveti G.,Piccirillo A.,Bagnoli P.E.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. Complete characterisation of laser diode thermal circuit by voltage transient measurements

2. Proc. ESSDERC Conf. 93;Bagnoli,1993

3. Proc. ISHM Conf. 94;Bagnoli,1994

4. Proc. ISHM Conf. 94;Maierna,1994

5. Proc. SEMITHERM '94;Sofia,1994

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