Author:
Hanß Alexander,Schmid Maximilian,Liu E,Elger Gordon
Subject
General Physics and Astronomy
Cited by
34 articles.
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1. Fast Characterization of Power LEDs: Circuit Design and Experimental Results;IEEE Transactions on Electron Devices;2024-06
2. Infrared Thermal Imaging-Based Power MOSFET Thermal Resistance Test Method Research;2023 Global Reliability and Prognostics and Health Management Conference (PHM-Hangzhou);2023-10-12
3. Transient thermal analysis for VCSEL Diodes;2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC);2023-09-27
4. Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability;IEEE Transactions on Device and Materials Reliability;2023-09
5. Crack Growth Prediction in High-Power LEDs from TTA, SAM and Simulated Data;2022 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC);2022-09-28