Recent developments in dynamic transmission electron microscopy-Reference-Cited by-同舟云学术

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Recent developments in dynamic transmission electron microscopy

Published:2012-02 Issue:1 Volume:16 Page:23-30
ISSN:1359-0286
Container-title:Current Opinion in Solid State and Materials Science
language:en
Short-container-title:Current Opinion in Solid State and Materials Science

Author:

Browning N.D.,Bonds M.A.,Campbell G.H.,Evans J.E.,LaGrange T.,Jungjohann K.L.,Masiel D.J.,McKeown J.,Mehraeen S.,Reed B.W.,Santala M.

Publisher

Elsevier BV

Subject

General Materials Science

Reference52 articles.

1. Electron microscopy image enhanced

2. Sub-ångstrom resolution using aberration corrected electron optics

3. Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

4. Element-selective imaging of atomic columns in a crystal using STEM and EELS

5. Towards full-structure determination of bimetallic nanoparticles with an aberration-corrected electron microscope

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