An optimal design of accelerated life test for exponential distribution
Author:
Publisher
Elsevier BV
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Reference7 articles.
1. A comparison of accelerated life test plans for Weibull and lognormal distributions and type 1 censoring;Meeker;Technometrics,1984
2. Optimum censored accelerated life tests for normal and lognormal life distributions;Kielpinski;IEEE Trans. Reliability,1975
3. Theory for optimum censored accelerated life tests for normal and lognormal life distributions;Nelson;Technometrics,1975
4. Optimum accelerated life tests for the Weibull and extreme value distributions;Meeker;IEEE Trans. Reliability,1975
5. Theory for optimum accelerated censored life tests for Weibull and extreme value distributions;Nelson;Technometrics,1978
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