Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)-Reference-Cited by-同舟云学术

Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Published:2023-01 Issue: Volume:210 Page:110833
ISSN:0010-938X
Container-title:Corrosion Science
language:en
Short-container-title:Corrosion Science

Author:

Yue Xiaoqi,Malmberg Per,Isotahdon Elisa,Ratia-Hanby Vilma,Huttunen-Saarivirta Elina,Leygraf Christofer,Pan Jinshan

Funder

Vetenskapsrådet

Nordic Nuclear Safety Research

Publisher

Elsevier BV

Subject

General Materials Science,General Chemical Engineering,General Chemistry

Reference58 articles.

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2. Saanio, T.; Ikonen, A.; Keto, P.; Kirkkomäki, T.; Kukkola, T.; Nieminen, J.; Raiko, H. Design of the Disposal Facility 2012; POSIVA-WR-13–17; Posiva, Finland, 2013.

3. Corrosion of copper in oxygen-deficient groundwater with and without deep bedrock micro-organisms: characterisation of microbial communities and surface processes;Huttunen-Saarivirta;Appl. Surf. Sci.,2017

4. Corrosion of copper in anoxic ground water in the presence of SRB;Carpen;Corros. Sci. Technol.,2018

5. Kinetic properties of the passive film on copper in the presence of sulfate-reducing bacteria;Huttunen-Saarivirta;J. Electrochem. Soc.,2018

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