Digital background calibration of ultra-high-speed time-interleaved of PAM4 2-bit DACs

Author:

Katz GiladORCID,Romano Russ,Zortea Tony

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering

Reference9 articles.

1. An interleaved full nyquist high-speed DAC technique;Olieman;IEEE J Solid-State Circuits,2015

2. A 10-b 120-M sample/s time-interleaved;Jamal;IEEE J Solid-State Circuits,2002

3. A 12-GS/s 81-mW 5-bit time-interleaved flash ADC with background timing skew calibration;El-Chammas;IEEE J Solid-State Circuits,2011

4. A background sample-time error calibration technique using random data for wide-band high-resolution time-interleaved ADCs;Haftbaradaran;IEEE Trans Circuits Syst II, Exp Breifs,2008

5. Explicit analysis of channel mismatch effects in time-interleaved ADC systems;Kurosawa;IEEE Trans Circuits Syst I, Fundam Theory Appl,2001

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