Grain size and electrical resistivity measurements on aluminum polycrystalline thin films
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference10 articles.
1. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
2. Size effects in thin films;Tellier,1982
3. A three-dimensional model for grain boundary resistivity in metal films
4. Mayadas-Shatzkes conduction in nucleation-grown r.f. sputtered films of aluminium
5. Resistivity and Structure of Evaporated Aluminum Films
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