Total external X-ray reflection: A novel method of surface chemical analysis
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference16 articles.
1. CXVII. The total reflexion of X-rays
2. Observational Techniques in X-Ray Astronomy
3. Density measurements of thin germanium films by total reflection of X-rays
4. Characterization of thin film thickness and density by low angle X-ray interference
5. Surface Studies of Solids by Total Reflection of X-Rays
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Total external reflection of X-rays from solid surfaces;Technical Physics;2017-01
2. The ion implantation of helium into gold. A combined X-ray reflection spectroscopy and Rutherford backscattering study;physica status solidi (a);1986-05-16
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