1. Surface Metrology Application for a Direct Digital Long Range Transducer;Garratt,1980
2. Laboratory Evaluation of a High Resolution X-Ray Microscope;Silk,1979
3. The Measurement of Optical Flatness;Dew;J. Phys. E: Sci. Instrum.,1966
4. Optical Components for X-Ray Microscopy;Franks;M. Ann. N.Y. Acad. Sci.,1980