Study of surface/interface and bulk defect density in a-Si:H by means of photothermal deflection spectroscopy and photoconductivity
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Photothermal and photoconductive determination of surface and bulk defect densities in amorphous silicon films
2. Optical absorption spectra of surface or interface states in hydrogenated amorphous silicon
3. A study of hydrogenated amorphous silicon deposited by hot‐wall glow discharge
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5. The study of transport and related properties of amorphous silicon by transient experiments
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