Low-cost test technique using a new RF BIST circuit for 4.5–5.5GHz low noise amplifiers-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Low-cost test technique using a new RF BIST circuit for 4.5–5.5GHz low noise amplifiers

Published:2005-08 Issue:8 Volume:36 Page:770-777
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Ryu Jee-Youl,Kim Bruce C.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. Novel defect testing of rf front end using input matching measurement;Ryu,2003

2. A new BIST scheme for 5GHz low noise amplifiers;Ryu,2004

3. BIST: loopback spectral signature analysis;Lupea,2003

4. BiST model for IC rf-transceiver front-end;Dabrowski,2003

5. A signature test framework for rapid production testing of rf circuits;Voorakaranam,2003

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers;IEEE Open Journal of Circuits and Systems;2023

2. A Programmable Compensation Circuit for System-on-Chip Application;JSTS:Journal of Semiconductor Technology and Science;2011-09-30

3. A Built-In-Test Circuit for RF Differential Low Noise Amplifiers;IEEE Transactions on Circuits and Systems I: Regular Papers;2010-07

4. Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs;Journal of Electronic Testing;2010-01-19

5. A review of test techniques for RFIC’s and an application of a proposed approach in a 1.9-GHz CMOS mixer;2008 26th International Conference on Microelectronics;2008-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP