Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-009-5129-z.pdf
Reference20 articles.
1. Akbay SS, Chatterjee A (2005) Built-in test of RF components using mapped feature extraction sensors. VLSI Test Symposium 243–248.
2. Bhattacharya, S Chatterjee A (2004). Use of embedded sensors for built-in-test of RF circuits. International Test Conference 801–809.
3. Chun-Lung H, Yiting L, Shu-Wei W (2005) Built-in self-test for phase-locked loops. IEEE Trans Instrum Meas 54(3):996–1002
4. Fan X, Onabajo M, Fernández-Rodríguez FO, Silva-Martinez J, Sánchez-Sinencio E (2008) A current injection built-in test technique for rf low-noise amplifiers. IEEE Trans Circuits Syst—I 55(7):1794–1804, regular papers
5. Gopalan A, Das T, Washburn C, Mukund PR (2005) An ultra-fast, on-chip BIST for RF low noise amplifiers. VLSI design 485–490.
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1. Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor;Journal of Electronic Testing;2012-03-09
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