An ADC BIST using on-chip ramp generation and digital ORA
Author:
Funder
University Grants Committee
Publisher
Elsevier BV
Subject
General Engineering
Reference15 articles.
1. Fully digital strategy for fast calibration and test of ƩΔ ADCs;Venuto;Microelectron. J.,2007
2. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC;Kerzerho;Microelectron. J.,2013
3. On-chip ramp generators for mixed-signal BIST and ADC self-test;Benoit;IEEE J. Solid-State Circ.,2003
4. Analog built-in saw-tooth generator for ADC histogram test;Aza;Microelectron. J.,2002
5. A time tick based method for measuring static errors of ADC;Hariharan;J. Instru. Exper. Tech.,2011
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